Fotodiodo BPW34 - Apuntes 1 PDF

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BPW34 Vishay Semiconductors

Silicon PIN Photodiode Description The BPW34 is a high speed and high sensitive PIN photodiode in a miniature flat plastic package. Its top view construction makes it ideal as a low cost replacement of TO–5 devices in many applications. Due to its waterclear epoxy the device is sensitive to visible and infrared radiation. The large active area combined with a flat case gives a high sensitivity at a wide viewing angle. 94 8583

Features Large radiant sensitive area (A=7.5 mm2) Wide angle of half sensitivity = 65 High photo sensitivity Fast response times Small junction capacitance Suitable for visible and near infrared radiation

Applications High speed photo detector

Absolute Maximum Ratings Tamb = 25 C Parameter Reverse Voltage Power Dissipation Junction Temperature Storage Temperature Range Soldering Temperature Thermal Resistance Junction/Ambient

Document Number 81521 Rev. 2, 20-May-99

Test Conditions Tamb

t

3s

25 C

Symbol VR PV Tj Tstg Tsd RthJA

Value 60 215 100 –55...+100 260 350

Unit V mW C C C K/W

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BPW34 Vishay Semiconductors Basic Characteristics Tamb = 25 C Parameter Breakdown Voltage Reverse Dark Current Diode Capacitance Open Circuit Voltage Temp. Coefficient of Vo Short Circuit Current Temp. Coefficient of Ik Reverse Light Current

Test Conditions IR = 100 A, E = 0 VR = 10 V, E = 0 VR = 0 V, f = 1 MHz, E = 0 VR = 3 V, f = 1 MHz, E = 0 Ee = 1 mW/cm2, = 950 nm Ee = 1 mW/cm2, = 950 nm EA = 1 klx Ee = 1 mW/cm2, = 950 nm Ee = 1 mW/cm2, = 950 nm EA = 1 klx, VR = 5 V Ee = 1 mW/cm2, = 950 nm, VR = 5 V

Symbol V(BR) Iro CD CD Vo TKVo Ik Ik TKIk Ira Ira

Angle of Half Sensitivity Wavelength of Peak Sensitivity Range of Spectral Bandwidth Noise Equivalent Power VR = 10 V, = 950 nm Rise Time VR = 10 V, RL = 1k , = 820 nm Fall Time VR = 10 V, RL = 1k , = 820 nm

Min 60

40

Typ

Max

2 70 25 350 –2.6 70 47 0.1 75 50

30 40

Unit V nA pF pF mV mV/K A A %/K A A

NEP tr

65 900 600...1050 4x10–14 100

deg nm nm W/ Hz ns

tf

100

ns

p 0.5

Typical Characteristics (Tamb = 25 C unless otherwise specified) 1.4

I ra rel – Relative Reverse Light Current

Iro – Reverse Dark Current ( nA )

1000

100

10

VR=10V

VR=5V =950nm

1.2

1.0

0.8

0.6

1 20 94 8403

40 60 80 Tamb – Ambient Temperature ( C )

100

Figure 1. Reverse Dark Current vs. Ambient Temperature

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0 94 8416

20 40 60 80 Tamb – Ambient Temperature ( C )

100

Figure 2. Relative Reverse Light Current vs. Ambient Temperature

Document Number 81521 Rev. 2, 20-May-99

BPW34 Vishay Semiconductors 80 CD – Diode Capacitance ( pF )

– Reverse Light Current ( A )

1000

100

10

VR=5V =950nm

60

40

20

I

ra

1

E=0 f=1MHz

0.1 0.01

0.1

1

Ee – Irradiance ( mW / cm2 )

94 8417

1

Figure 6. Diode Capacitance vs. Reverse Voltage )rel – Relative Spectral Sensitivity

1000

100

10 VR=5V

1.0 0.8 0.6 0.4 0.2

S(

I

ra

1

100

10

VR – Reverse Voltage ( V )

94 8407

Figure 3. Reverse Light Current vs. Irradiance

– Reverse Light Current ( A )

0 0.1

10

0.1 101

102

103

EA – Illuminance ( lx )

94 8418

0 350

104

550

Figure 4. Reverse Light Current vs. Illuminance

750

Figure 7. Relative Spectral Sensitivity vs. Wavelength 0

10

20 30

S rel – Relative Sensitivity

1 mW/cm2 0.5 mW/cm2 0.2 mW/cm2 10 0.1 mW/cm2 0.05 mW/cm2

40 1.0 0.9

50

0.8

60 70

0.7

I

ra

– Reverse Light Current ( A )

100

80

=950nm

1 0.1 94 8419

1150

950

– Wavelength ( nm )

94 8420

1

10

100

VR – Reverse Voltage ( V )

Figure 5. Reverse Light Current vs. Reverse Voltage

Document Number 81521 Rev. 2, 20-May-99

0.6

0.4

0.2

0

0.2

0.4

0.6

94 8406

Figure 8. Relative Radiant Sensitivity vs. Angular Displacement

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BPW34 Vishay Semiconductors Dimensions in mm

96 12186

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Document Number 81521 Rev. 2, 20-May-99

BPW34 Vishay Semiconductors Ozone Depleting Substances Policy Statement It is the policy of Vishay Semiconductor GmbH to 1. Meet all present and future national and international statutory requirements. 2. Regularly and continuously improve the performance of our products, processes, distribution and operating systems with respect to their impact on the health and safety of our employees and the public, as well as their impact on the environment. It is particular concern to control or eliminate releases of those substances into the atmosphere which are known as ozone depleting substances ( ODSs ). The Montreal Protocol ( 1987 ) and its London Amendments ( 1990 ) intend to severely restrict the use of ODSs and forbid their use within the next ten years. Various national and international initiatives are pressing for an earlier ban on these substances. Vishay Semiconductor GmbH has been able to use its policy of continuous improvements to eliminate the use of ODSs listed in the following documents. 1. Annex A, B and list of transitional substances of the Montreal Protocol and the London Amendments respectively 2 . Class I and II ozone depleting substances in the Clean Air Act Amendments of 1990 by the Environmental Protection Agency ( EPA ) in the USA 3. Council Decision 88/540/EEC and 91/690/EEC Annex A, B and C ( transitional substances ) respectively. Vishay Semiconductor GmbH can certify that our semiconductors are not manufactured with ozone depleting substances and do not contain such substances.

We reserve the right to make changes to improve technical design and may do so without further notice. Parameters can vary in different applications. All operating parameters must be validated for each customer application by the customer. Should the buyer use Vishay-Semiconductors products for any unintended or unauthorized application, the buyer shall indemnify Vishay-Semiconductors against all claims, costs, damages, and expenses, arising out of, directly or indirectly, any claim of personal damage, injury or death associated with such unintended or unauthorized use. Vishay Semiconductor GmbH, P.O.B. 3535, D-74025 Heilbronn, Germany Telephone: 49 ( 0 ) 7131 67 2831, Fax number: 49 ( 0 ) 7131 67 2423

Document Number 81521 Rev. 2, 20-May-99

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